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dc.contributor.authorDiday, Edwin
dc.contributor.authorSimon, J.C.
HAL ID: 1493
ORCID: 0000-0002-4996-6768
dc.date.accessioned2014-05-06T16:48:33Z
dc.date.available2014-05-06T16:48:33Z
dc.date.issued1980
dc.identifier.urihttps://basepub.dauphine.fr/handle/123456789/13249
dc.language.isoenen
dc.subjectclustersen
dc.subject.ddc519en
dc.titleClustering Analysisen
dc.typeChapitre d'ouvrage
dc.relation.ispartoftitleDigital pattern recognitionen
dc.relation.ispartofeditorFu, King-Sun
dc.relation.ispartofpublnameSpringeren
dc.relation.ispartofpublcityBerlinen
dc.relation.ispartofdate1980
dc.relation.ispartofpages234en
dc.subject.ddclabelProbabilités et mathématiques appliquéesen
dc.relation.ispartofisbn0-387-10207-8en
dc.relation.forthcomingnonen


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